presents
A unique package of products for user-friendly observation of moist samples in their native state under A-ESEM conditions.
TDS
software
Temperature
control unit
with detector
of signal electrons
Cooled
sample holder
Workflow
These products significantly improve the functional properties and expand the application potential of environmental scanning electron microscopes (ESEM) in both research and industrial practice. The products are part of the new Advanced Environmental Scanning Electron Microscopy (A-ESEM) technologies used to study samples in their native state.
Our newly developed products greatly simplify, speed up, and reduce the cost of imaging and analyzing a wide range of samples, from liquids to moist solid samples such as biopolymers, hydrogels, plastics, rubbers, and biological samples in their native state.
Unlike other electron microscopic methods, samples can be analyzed directly without the need for drying, chemical fixation, or freezing, avoiding the use of any additional time-consuming and costly methods and complex preparations.
Observing samples without the use of chemical fixation is also much more environmentally friendly and provides more valuable information.
Designed for all brands of low-vacuum electron microscopes.
Benefits
Pre-observation
Samples in their native state without preparation
Pre-observation
Precise adjustment
and on-line measurement of sample temperature down to -60 °C
Pre-observation
Visualisation of pressure, temperature and humidity distribution around
the sample
Pre-observation
The SW allows the selection of sample type, holder and working distance
Pre-observation
Intuitive SW for fast AI-prediction of thermodynamic conditions
Observation
In-situ studies
of dynamic processes
Observation
Integrated high-efficiency signal electron detector
Observation
Intact samples without cryo-preparation and artefacts
Observation
High-resolution low-dose imaging of moist samples
Observation
Fast and easy using
Low-temperature method
Products
with detector of signal electrons
Cooled
sample holder
The ingenious combination of cooled, wide temperature range sample holder with high-efficiency detector of signal electrons and electronics.
Prototype of a New Cooled Sample Holder with Integrated High-Efficiency Ionization Detector for ESEM
It is designed for studying highly hydrated or liquid samples from both living and non-living nature in a high water vapor pressure environment of an environmental scanning electron microscope (ESEM). It consists of two parts:
Cooled Sample Holder (CSH):
It is used to cool the sample within a temperature range of 30 to -60 °C, with the cooling rate being adjustable. A unique feature of this type of cooled sample holder is its high precision in setting and maintaining the temperature of the observed sample, based on accurate on-line measurement and regulation of temperature and humidity during operation.
High-Efficiency Ionization Detector (ID):
Integrated into the CSH, it is used to detect signal electrons for imaging samples in a high-pressure gas environment in the ESEM specimen chamber (5 to 1000 Pa). The ID stands out due to the specific positioning of the detection electrode close to/in the plane of the sample, as well as the specially designed shape of the detection electrode, which allows much higher detection efficiency than commonly used detectors from other manufacturers. The use of the CSH with ID is not limited by the type of electron microscope manufacturer and can be integrated into any type and brand of microscope. The ID is one of the most efficient detectors of signal electrons for A-ESEM/ESEM in the world and is protected by a patent.
TDS
software
The software allows you to optimize thermodynamic conditions such as relative humidity, temperature and vapor pressure in the sample vicinity and visualize their distribution in the specimen chamber of the A-ESEM.
Software for Optimizing Thermodynamic Conditions in the ESEM Sample Chamber: ThermoDynamic Simulator (TDS)
This is a unique software with artificial intelligence elements for rapid prediction, visualization, and optimization of thermodynamic conditions that allow moist samples to be maintained in their fully hydrated native state in an advanced environmental scanning electron microscope (A-ESEM).
The TDS software has an intuitive interface and provides quick calculations of pressure, temperature, and humidity in the immediate vicinity of the observed sample, taking into account its material (biological, clay, glass, polymer, and wood), type of sample holder (plate, dish), and other microscope settings.
The results from TDS allow the A-ESEM/ESEM operator to protect the sample from adverse effects in the electron microscope's sample chamber, thereby minimizing the likelihood of its damage or destruction. Similar software is not available on the market—it significantly improves the functional properties of ESEM/A-ESEM and makes its operation more user-friendly.
Samples
Any details about the sample
Temperature control unit
Together with the sample holder, this unit allows to easily set the target sample temperature target value or defined temperature gradient.
Prototype of Control Electronics for the Cooled Sample Holder
The control unit is used to set and regulate the temperature for cooling the sample placed on the high-tech cooled sample holder. Samples can be cooled within a temperature range of 30 °C to -60 °C with a temperature change rate of 1 to 30 °C/min.
It is also possible to define a so-called ramp, or the duration of staying at a defined temperature and the rate of transition to another value. The desired target temperature and temperature ramp-up rate are controlled by a PID controller. The proportional (P) and derivative (D) components can be user-modified, both for target temperature regulation and the ramp.
The control electronics can be connected to up to four PT 100 temperature sensors, and one sensor can be selected as the reference data source for more precise regulation, which is unique worldwide.
The control electronics can be integrated into any electron microscope, it is not limited by the type and brand of the microscope.
Contact
For further information,
details, and purchasing options,
please contact our product specialist.
Assoc. Prof. Vilém Neděla, M.Sc. et M.Sc., Ph.D., Res. Prof.